rf breakdown tests of mm-wave metallic accelerating structures

We are exploring the physics and frequency-scaling of vacuum rf breakdowns at sub-THz frequencies. We present the experimental results of rf tests performed in metallic mm-wave accelerating structures. These experiments were carried out at the facility for advanced accelerator experimental tests (FA...

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Bibliographic Details
Main Authors: Massimo Dal Forno, Valery Dolgashev, Gordon Bowden, Christine Clarke, Mark Hogan, Doug McCormick, Alexander Novokhatski, Bruno Spataro, Stephen Weathersby, Sami G. Tantawi
Format: Article
Language:English
Published: American Physical Society 2016-01-01
Series:Physical Review Accelerators and Beams
Online Access:http://doi.org/10.1103/PhysRevAccelBeams.19.011301
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Summary:We are exploring the physics and frequency-scaling of vacuum rf breakdowns at sub-THz frequencies. We present the experimental results of rf tests performed in metallic mm-wave accelerating structures. These experiments were carried out at the facility for advanced accelerator experimental tests (FACET) at the SLAC National Accelerator Laboratory. The rf fields were excited by the FACET ultrarelativistic electron beam. We compared the performances of metal structures made with copper and stainless steel. The rf frequency of the fundamental accelerating mode, propagating in the structures at the speed of light, varies from 115 to 140 GHz. The traveling wave structures are 0.1 m long and composed of 125 coupled cavities each. We determined the peak electric field and pulse length where the structures were not damaged by rf breakdowns. We calculated the electric and magnetic field correlated with the rf breakdowns using the FACET bunch parameters. The wakefields were calculated by a frequency domain method using periodic eigensolutions. Such a method takes into account wall losses and is applicable to a large variety of geometries. The maximum achieved accelerating gradient is 0.3  GV/m with a peak surface electric field of 1.5  GV/m and a pulse length of about 2.4 ns.
ISSN:2469-9888