Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests
Micro-compression testing of focused ion beam fabricated pillars is a popular technique for mechanical characterization at small scales. However, there are concerns associated with these ion-prepared samples, including irradiation damage from Ga ions and Ga segregation at grain boundaries resulting...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2019-11-01
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| Series: | Materials & Design |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0264127519303521 |