Proximity Effect induced transport Properties between MBE grown (Bi1−xSbx)2Se3 Topological Insulators and Magnetic Insulator CoFe2O4

Proximity Effect induced transport Properties between MBE grown (Bi1−xSbx)2Se3 Topological Insulators and Magnetic Insulator CoFe2O4

Abstract In this study, we investigate the proximity effect in topological insulator (TI) and magnetic insulator bilayer system. (Bi1−xSbx)2Se3/CoFe2O4 (CFO) heterostructure was fabricated using molecular beam epitaxy and pulsed laser deposition system respectively. As revealed from the magnetoresis...

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Bibliographic Details
Main Authors: Shun-Yu Huang, Cheong-Wei Chong, Yi Tung, Tzu-Chin Chen, Ki-Chi Wu, Min-Kai Lee, Jung-Chun-Andrew Huang, Z. Li, H. Qiu
Format: Article
Language:English
Published: Nature Publishing Group 2017-05-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-017-02662-8

Internet

https://doi.org/10.1038/s41598-017-02662-8

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