| Summary: | Streaking of photoelectrons with optical lasers has been widely used for temporal characterization of attosecond extreme ultraviolet pulses. Recently, this technique has been adapted to characterize femtosecond x-ray pulses in free-electron lasers with the streaking imprinted by far-infrared and terahertz (THz) pulses. Here, we report successful implementation of THz streaking for time stamping of an ultrashort relativistic electron beam, whose energy is several orders of magnitude higher than photoelectrons. Such an ability is especially important for MeV ultrafast electron diffraction (UED) applications, where electron beams with a few femtosecond pulse width may be obtained with longitudinal compression, while the arrival time may fluctuate at a much larger timescale. Using this laser-driven THz streaking technique, the arrival time of an ultrashort electron beam with a 6-fs (rms) pulse width has been determined with 1.5-fs (rms) accuracy. Furthermore, we have proposed and demonstrated a noninvasive method for correction of the timing jitter with femtosecond accuracy through measurement of the compressed beam energy, which may allow one to advance UED towards a sub-10-fs frontier, far beyond the approximate 100-fs (rms) jitter.
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