Low Power Testing—What Can Commercial Design-for-Test Tools Provide?
Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve com...
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| Format: | Article |
| Language: | English |
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MDPI AG
2011-12-01
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| Series: | Journal of Low Power Electronics and Applications |
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| Online Access: | http://www.mdpi.com/2079-9268/1/3/357/ |