Image Recognition Method Based on an Improved Convolutional Neural Network to Detect Impurities in Wheat

Image Recognition Method Based on an Improved Convolutional Neural Network to Detect Impurities in Wheat

Impurities in wheat seriously affect wheat quality and food security. They are mainly produced during the operational process of combine harvesters. To solve the recognition and classification problems associated with impurities in wheat, a recognition method using an improved convolutional neural n...

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Bibliographic Details
Main Authors: Yin Shen, Yanxin Yin, Chunjiang Zhao, Bin Li, Jun WANG, Guanglin Li, Ziqiang Zhang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Wheat images
impurity recognition
convolution neural network
WheNet network
Online Access:https://ieeexplore.ieee.org/document/8865031/

Internet

https://ieeexplore.ieee.org/document/8865031/

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