Classical Size Effects in Sb Doped SnTe Thin Films
<span>The possibility of obtaining strongly degenerate (> 4×10<sup>20</sup> сm<sup>-3</sup>) SnTe thin films (d = 200 - 2000 nm) with p-type conductivity by thermal evaporation in vacuum of SnTe crystals doped with Sb, with subsequent condensation onto as (0001)...
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Vasyl Stefanyk Precarpathian National University
2018-01-01
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| Series: | Фізика і хімія твердого тіла |
| Online Access: | http://journals.pu.if.ua/index.php/pcss/article/view/2254 |
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doaj-b2b8027cda604108a3c4e22b1cffd9f22020-11-25T02:21:14ZengVasyl Stefanyk Precarpathian National UniversityФізика і хімія твердого тіла1729-44282309-85892018-01-01181757710.15330/pcss.18.1.75-771966Classical Size Effects in Sb Doped SnTe Thin FilmsYa. P. Saliy0Прикарпатський національний університет імені Василя Стефаника<span>The possibility of obtaining strongly degenerate (> 4×10<sup>20</sup> сm<sup>-3</sup>) SnTe thin films (d = 200 - 2000 nm) with p-type conductivity by thermal evaporation in vacuum of SnTe crystals doped with Sb, with subsequent condensation onto as (0001) mica and sytal substrates, was established. The thickness dependences of electro-physical properties of thin films were obtained. In this region of thickness there was growth of the carrier mobility with thickness, which is attributable to manifestation of classical size effect and interpreted in the framework of Fuchs-Sondheimer theory. These measurements show little correlation between the length of free path of charge cattiers and the lateral diameter of surface objects. </span><strong><br />Key words:</strong><span> tin telluride, thin film, thickness, size effect.</span>http://journals.pu.if.ua/index.php/pcss/article/view/2254 |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Ya. P. Saliy |
| spellingShingle |
Ya. P. Saliy Classical Size Effects in Sb Doped SnTe Thin Films Фізика і хімія твердого тіла |
| author_facet |
Ya. P. Saliy |
| author_sort |
Ya. P. Saliy |
| title |
Classical Size Effects in Sb Doped SnTe Thin Films |
| title_short |
Classical Size Effects in Sb Doped SnTe Thin Films |
| title_full |
Classical Size Effects in Sb Doped SnTe Thin Films |
| title_fullStr |
Classical Size Effects in Sb Doped SnTe Thin Films |
| title_full_unstemmed |
Classical Size Effects in Sb Doped SnTe Thin Films |
| title_sort |
classical size effects in sb doped snte thin films |
| publisher |
Vasyl Stefanyk Precarpathian National University |
| series |
Фізика і хімія твердого тіла |
| issn |
1729-4428 2309-8589 |
| publishDate |
2018-01-01 |
| description |
<span>The possibility of obtaining strongly degenerate (> 4×10<sup>20</sup> сm<sup>-3</sup>) SnTe thin films (d = 200 - 2000 nm) with p-type conductivity by thermal evaporation in vacuum of SnTe crystals doped with Sb, with subsequent condensation onto as (0001) mica and sytal substrates, was established. The thickness dependences of electro-physical properties of thin films were obtained. In this region of thickness there was growth of the carrier mobility with thickness, which is attributable to manifestation of classical size effect and interpreted in the framework of Fuchs-Sondheimer theory. These measurements show little correlation between the length of free path of charge cattiers and the lateral diameter of surface objects. </span><strong><br />Key words:</strong><span> tin telluride, thin film, thickness, size effect.</span> |
| url |
http://journals.pu.if.ua/index.php/pcss/article/view/2254 |
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AT yapsaliy classicalsizeeffectsinsbdopedsntethinfilms |
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