Data analytics to reduce stop-on-fail test in electronics manufacturing

Data analytics to reduce stop-on-fail test in electronics manufacturing

The use of data driven techniques is popular in smart manufacturing. Machine learning, statistics or a combination of both have been used to improve processes in electronic manufacturing. This paper presents the application of classical techniques to reduce production cycle time by compacting a prod...

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Bibliographic Details
Main Authors: Herrera Ana Elsa Hinojosa, Stoyanov Stoyan, Bailey Chris, Walshaw Chris, Yin Chunyan
Format: Article
Language:English
Published: De Gruyter 2019-08-01
Series:Open Computer Science
Subjects:
decision tree
logistic regression
random forest
incomplete dataset
electronic device
Online Access:https://doi.org/10.1515/comp-2019-0014

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