Data analytics to reduce stop-on-fail test in electronics manufacturing
The use of data driven techniques is popular in smart manufacturing. Machine learning, statistics or a combination of both have been used to improve processes in electronic manufacturing. This paper presents the application of classical techniques to reduce production cycle time by compacting a prod...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2019-08-01
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| Series: | Open Computer Science |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/comp-2019-0014 |