EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION

EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION

With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of...

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Bibliographic Details
Main Authors: A. I. Belous, A. V. Prybylski
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
дефект
отказ
надежность
пробой диэлектрика
Online Access:https://doklady.bsuir.by/jour/article/view/148
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spelling doaj-b299a5a0f544435aba3e708af82d62362021-07-28T16:19:44ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482019-06-01019496147EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATIONA. I. Belous0A. V. Prybylski1ОАО «ИНТЕГРАЛ»Белорусский государственный университет информатики и радиоэлектроникиWith increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.https://doklady.bsuir.by/jour/article/view/148дефектотказнадежностьпробой диэлектрика
collection DOAJ
language Russian
format Article
sources DOAJ
author A. I. Belous
A. V. Prybylski
spellingShingle A. I. Belous
A. V. Prybylski
EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
дефект
отказ
надежность
пробой диэлектрика
author_facet A. I. Belous
A. V. Prybylski
author_sort A. I. Belous
title EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
title_short EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
title_full EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
title_fullStr EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
title_full_unstemmed EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
title_sort effective method of unreliable cmos circuts identification
publisher Educational institution «Belarusian State University of Informatics and Radioelectronics»
series Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
issn 1729-7648
publishDate 2019-06-01
description With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.
topic дефект
отказ
надежность
пробой диэлектрика
url https://doklady.bsuir.by/jour/article/view/148
work_keys_str_mv AT aibelous effectivemethodofunreliablecmoscircutsidentification
AT avprybylski effectivemethodofunreliablecmoscircutsidentification
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