Toward a Faster Screening of Faulty Digital Chips via Current-Bound Estimation Based on Device Size and Threshold Voltage
Observations of peak and average currents are important for designed circuits, as faulty circuits have abnormal peaks and average currents. Using current bounds to detect faulty chips is a comparatively innovative idea, and many advanced schemes without them use it as a component in statistical outl...
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| Format: | Article |
| Language: | English |
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MDPI AG
2016-05-01
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| Series: | Journal of Low Power Electronics and Applications |
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| Online Access: | http://www.mdpi.com/2079-9268/6/2/6 |