Defect Inspection in Display Panel Using Concentrated Auto Encoder
In this paper, concentrated auto encoder (CAE) is proposed for aligning photo spacer (PS) and for local inspection of PS. The CAE method has two characteristics. First, unaligned images can be moved to the same alignment position, which makes it possible to move the measured PS images to the same po...
Main Author: | DongHun Ku |
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Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2019-01-01
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Series: | International Journal of Optics |
Online Access: | http://dx.doi.org/10.1155/2019/8039267 |
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