HIGH FREQUENCY OHMIC LOSSES IN TERAHERTZ FREQUENCY RANGE CW CLINOTRONS

Reliable simulations of electron-vacuum devices’ opera-tion parameters are an actual challenge during the R&D process. One of the most important problems is determining high frequency ohmic losses and taking them into account in the simulation. The surface roughness investigation of the clinotro...

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Bibliographic Details
Main Authors: Yu. S. Kovshov, S. S. Ponomarenko, S. A. Kishko, S. A. Vlasenko, A. A. Lihachev, V. V. Zavertanniy, E. M. Khutoryan, A. N. Kuleshov
Format: Article
Language:English
Published: Akademperiodyka 2017-03-01
Series:Радиофизика и электроника
Subjects:
Online Access:http://re-journal.org.ua/sites/default/files/file_attach/arh_fulltxt/11.pdf