One approach to compact testing of digital circuits
A problem of signature analyzer synthesis with required properties is solved for digital schemes compact testing. The main attention is devoted to the issues of eliminating losses of diagnostic information and to simplicity of structural organization. Solutions are based on detecting all error vecto...
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| Format: | Article |
| Language: | English |
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Institut za istrazivanja i projektovanja u privredi
2019-01-01
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| Series: | Istrazivanja i projektovanja za privredu |
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| Online Access: | https://scindeks-clanci.ceon.rs/data/pdf/1451-4117/2019/1451-41171901026F.pdf |