Gas-assisted silver deposition with a focused electron beam

• Main Authors: Luisa Berger, Katarzyna Madajska, Iwona B. Szymanska, Katja Höflich, Mikhail N. Polyakov, Jakub Jurczyk, Carlos Guerra-Nuñez, Ivo Utke
• Format: Article
• Language: English
• Published: Beilstein-Institut 2018-01-01
• Series: Beilstein Journal of Nanotechnology
• Subjects: focused electron beam induced deposition; low volatility precursor; silver
• Online Access: https://doi.org/10.3762/bjnano.9.24

Focused electron beam induced deposition (FEBID) is a flexible direct-write method to obtain defined structures with a high lateral resolution. In order to use this technique in application fields such as plasmonics, suitable precursors which allow the deposition of desired materials have to be identified. Well known for its plasmonic properties, silver represents an interesting candidate for FEBID. For this purpose the carboxylate complex silver(I) pentafluoropropionate (AgO2CC2F5) was used for the first time in FEBID and resulted in deposits with high silver content of up to 76 atom %. As verified by TEM investigations, the deposited material is composed of pure silver crystallites in a carbon matrix. It showed good electrical properties and a strong Raman signal enhancement. Interestingly, silver crystal growth presents a strong dependency on electron dose and precursor refreshment.