Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry
In this work, we have applied optical low-coherence reflectometry (OLCR), implemented with infra-red light propagating in fiberoptic paths, to perform static and dynamic analyses on piezo-actuated glass micro-membranes. The actuator was fabricated by means of thin-film piezoelectric MEMS technology...
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doaj-a90ce3f9f82e4cd1845bffda1676e3a82020-11-24T22:17:01ZengMDPI AGSensors1424-82202017-02-0117346210.3390/s17030462s17030462Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence ReflectometrySabina Merlo0Paolo Poma1Eleonora Crisà2Dino Faralli3Marco Soldo4Dipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi di Pavia, 27100 Pavia, ItalyDipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi di Pavia, 27100 Pavia, ItalyDipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi di Pavia, 27100 Pavia, ItalySTMicroelectronics, 20864 Agrate Brianza (MB), ItalySTMicroelectronics, 20010 Cornaredo (Mi), ItalyIn this work, we have applied optical low-coherence reflectometry (OLCR), implemented with infra-red light propagating in fiberoptic paths, to perform static and dynamic analyses on piezo-actuated glass micro-membranes. The actuator was fabricated by means of thin-film piezoelectric MEMS technology and was employed for modifying the micro-membrane curvature, in view of its application in micro-optic devices, such as variable focus micro-lenses. We are here showing that OLCR incorporating a near-infrared superluminescent light emitting diode as the read-out source is suitable for measuring various parameters such as the micro-membrane optical path-length, the membrane displacement as a function of the applied voltage (yielding the piezo-actuator hysteresis) as well as the resonance curve of the fundamental vibration mode. The use of an optical source with short coherence-time allows performing interferometric measurements without spurious resonance effects due to multiple parallel interfaces of highly planar slabs, furthermore selecting the plane/layer to be monitored. We demonstrate that the same compact and flexible setup can be successfully employed to perform spot optical measurements for static and dynamic characterization of piezo-MEMS in real time.http://www.mdpi.com/1424-8220/17/3/462optical low-coherence reflectometryoptical measurementsthin-film piezo-electric actuatornon-destructive testing |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Sabina Merlo Paolo Poma Eleonora Crisà Dino Faralli Marco Soldo |
spellingShingle |
Sabina Merlo Paolo Poma Eleonora Crisà Dino Faralli Marco Soldo Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry Sensors optical low-coherence reflectometry optical measurements thin-film piezo-electric actuator non-destructive testing |
author_facet |
Sabina Merlo Paolo Poma Eleonora Crisà Dino Faralli Marco Soldo |
author_sort |
Sabina Merlo |
title |
Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry |
title_short |
Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry |
title_full |
Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry |
title_fullStr |
Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry |
title_full_unstemmed |
Testing of Piezo-Actuated Glass Micro-Membranes by Optical Low-Coherence Reflectometry |
title_sort |
testing of piezo-actuated glass micro-membranes by optical low-coherence reflectometry |
publisher |
MDPI AG |
series |
Sensors |
issn |
1424-8220 |
publishDate |
2017-02-01 |
description |
In this work, we have applied optical low-coherence reflectometry (OLCR), implemented with infra-red light propagating in fiberoptic paths, to perform static and dynamic analyses on piezo-actuated glass micro-membranes. The actuator was fabricated by means of thin-film piezoelectric MEMS technology and was employed for modifying the micro-membrane curvature, in view of its application in micro-optic devices, such as variable focus micro-lenses. We are here showing that OLCR incorporating a near-infrared superluminescent light emitting diode as the read-out source is suitable for measuring various parameters such as the micro-membrane optical path-length, the membrane displacement as a function of the applied voltage (yielding the piezo-actuator hysteresis) as well as the resonance curve of the fundamental vibration mode. The use of an optical source with short coherence-time allows performing interferometric measurements without spurious resonance effects due to multiple parallel interfaces of highly planar slabs, furthermore selecting the plane/layer to be monitored. We demonstrate that the same compact and flexible setup can be successfully employed to perform spot optical measurements for static and dynamic characterization of piezo-MEMS in real time. |
topic |
optical low-coherence reflectometry optical measurements thin-film piezo-electric actuator non-destructive testing |
url |
http://www.mdpi.com/1424-8220/17/3/462 |
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