Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model

In this paper we present an original method for n-channel power MOSFET resistance extraction in the operation mode (RDS(ON)). The IDS=f(VDS) electrical characteristics measurements for the transistor and the Body-Drain junction are realized for the experimental determination and the extraction (by n...

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Main Author: C. -T. Salame
Format: Article
Language:English
Published: Hindawi Limited 2001-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.23.175
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spelling doaj-a890cf3ac12c48a39c679b00c7b206ca2020-11-24T22:21:09ZengHindawi LimitedActive and Passive Electronic Components0882-75161563-50312001-01-0123417518310.1155/APEC.23.175Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation ModelC. -T. Salame0Radiation Technology, Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, 2629 JB Delft, The NetherlandsIn this paper we present an original method for n-channel power MOSFET resistance extraction in the operation mode (RDS(ON)). The IDS=f(VDS) electrical characteristics measurements for the transistor and the Body-Drain junction are realized for the experimental determination and the extraction (by numerical analysis) of RDS(ON), respectively. Values of this resistance are extracted for different positive bias applied between the gate and the source (+VGS). Physicals parameters obtained from the numerical analysis are inspected, and results shows that the numerically analysed junction characteristic is in very good correlation with the electrical measurementhttp://dx.doi.org/10.1155/APEC.23.175
collection DOAJ
language English
format Article
sources DOAJ
author C. -T. Salame
spellingShingle C. -T. Salame
Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
Active and Passive Electronic Components
author_facet C. -T. Salame
author_sort C. -T. Salame
title Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
title_short Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
title_full Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
title_fullStr Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
title_full_unstemmed Extraction of RDS(ON) of n-Channel Power MOSFET by Numerical Simulation Model
title_sort extraction of rds(on) of n-channel power mosfet by numerical simulation model
publisher Hindawi Limited
series Active and Passive Electronic Components
issn 0882-7516
1563-5031
publishDate 2001-01-01
description In this paper we present an original method for n-channel power MOSFET resistance extraction in the operation mode (RDS(ON)). The IDS=f(VDS) electrical characteristics measurements for the transistor and the Body-Drain junction are realized for the experimental determination and the extraction (by numerical analysis) of RDS(ON), respectively. Values of this resistance are extracted for different positive bias applied between the gate and the source (+VGS). Physicals parameters obtained from the numerical analysis are inspected, and results shows that the numerically analysed junction characteristic is in very good correlation with the electrical measurement
url http://dx.doi.org/10.1155/APEC.23.175
work_keys_str_mv AT ctsalame extractionofrdsonofnchannelpowermosfetbynumericalsimulationmodel
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