Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters

• Main Authors: Johannes Bieker, Richard G. Forbes, Stefan Wilfert, Helmut F. Schlaak
• Format: Article
• Language: English
• Published: IEEE 2019-01-01
• Series: IEEE Journal of the Electron Devices Society
• Subjects: Field electron emission; large area field emitters; micro-nano-integration; modelling; simulation
• Online Access: https://ieeexplore.ieee.org/document/8827488/

With a large-area field electron emitter (LAFE), it is desirable to choose the spacings of individual emitters in such a way that the LAFE-average emission current density and total current are maximised, when the effects of electrostatic depolarization (mutual screening) are taken into account. This paper uses simulations based on a finite element method to investigate how to do this for a LAFE with randomly distributed emitters. The approach is based on finding the apex field enhancement factor and the specific emission current for an emitter, as a function of the average nearest neighbor spacing between emitters. Using electrostatic simulations based on the finite element method, the influence of neighboring emitters on a reference emitter being placed at the LAFE centre is investigated. Arrays with 25 ideal (identical) conical emitters with rounded tops are studied for different emitter densities and applied macroscopic fields. A theoretical average spacing is derived from the Poisson Point Process Theory. An optimum average spacing, and hence optimum emitter density, can be predicted for each macroscopic field.