A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed ca...

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Main Authors: Wei Zhao, Song Liu, Hai Wang, Yan Liu, Shengkang Zhang, Chunyue Cheng, Keming Feng, Ilja Ocket, Dominique Schreurs, Bart Nauwelaers, Hongbo Qin, Xiaodong Yang
Format: Article
Language:English
Published: MDPI AG 2017-08-01
Series:Applied Sciences
Subjects:
microwave measurement
vector network analyzer (VNA)
calibration algorithm
calibration standard
on-wafer calibration
Online Access:https://www.mdpi.com/2076-3417/7/9/866
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spelling doaj-a71e4cf28f63476f993edd4081afb70f2020-11-25T00:33:39ZengMDPI AGApplied Sciences2076-34172017-08-017986610.3390/app7090866app7090866A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix RepresentationWei Zhao0Song Liu1Hai Wang2Yan Liu3Shengkang Zhang4Chunyue Cheng5Keming Feng6Ilja Ocket7Dominique Schreurs8Bart Nauwelaers9Hongbo Qin10Xiaodong Yang11Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, ChinaScience and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, ChinaSchool of Aerospace Science and Technology, Xidian University, Xi’an 710071, ChinaKey Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, ChinaScience and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, ChinaScience and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, ChinaScience and Technology on Metrology and Calibration Laboratory, Beijing Institute of Metrology and Measurement, Beijing 100854, ChinaDepartment of Electrical Engineering, University of Leuven, 3000 Leuven, BelgiumDepartment of Electrical Engineering, University of Leuven, 3000 Leuven, BelgiumDepartment of Electrical Engineering, University of Leuven, 3000 Leuven, BelgiumKey Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi’an 710071, ChinaSchool of Electronic Engineering, Xidian University, Xi’an 710071, ChinaThis paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.https://www.mdpi.com/2076-3417/7/9/866microwave measurementvector network analyzer (VNA)calibration algorithmcalibration standardon-wafer calibration
collection DOAJ
language English
format Article
sources DOAJ
author Wei Zhao
Song Liu
Hai Wang
Yan Liu
Shengkang Zhang
Chunyue Cheng
Keming Feng
Ilja Ocket
Dominique Schreurs
Bart Nauwelaers
Hongbo Qin
Xiaodong Yang
spellingShingle Wei Zhao
Song Liu
Hai Wang
Yan Liu
Shengkang Zhang
Chunyue Cheng
Keming Feng
Ilja Ocket
Dominique Schreurs
Bart Nauwelaers
Hongbo Qin
Xiaodong Yang
A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
Applied Sciences
microwave measurement
vector network analyzer (VNA)
calibration algorithm
calibration standard
on-wafer calibration
author_facet Wei Zhao
Song Liu
Hai Wang
Yan Liu
Shengkang Zhang
Chunyue Cheng
Keming Feng
Ilja Ocket
Dominique Schreurs
Bart Nauwelaers
Hongbo Qin
Xiaodong Yang
author_sort Wei Zhao
title A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
title_short A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
title_full A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
title_fullStr A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
title_full_unstemmed A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation
title_sort unified approach for reformulations of lrm/lrmm/lrrm calibration algorithms based on the t-matrix representation
publisher MDPI AG
series Applied Sciences
issn 2076-3417
publishDate 2017-08-01
description This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.
topic microwave measurement
vector network analyzer (VNA)
calibration algorithm
calibration standard
on-wafer calibration
url https://www.mdpi.com/2076-3417/7/9/866
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