A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed ca...

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Bibliographic Details
Main Authors: Wei Zhao, Song Liu, Hai Wang, Yan Liu, Shengkang Zhang, Chunyue Cheng, Keming Feng, Ilja Ocket, Dominique Schreurs, Bart Nauwelaers, Hongbo Qin, Xiaodong Yang
Format: Article
Language:English
Published: MDPI AG 2017-08-01
Series:Applied Sciences
Subjects:
microwave measurement
vector network analyzer (VNA)
calibration algorithm
calibration standard
on-wafer calibration
Online Access:https://www.mdpi.com/2076-3417/7/9/866
Description
Summary:This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.
ISSN:2076-3417

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