Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. Wit...

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Bibliographic Details
Main Authors: Osvaldo N. Oliveira, Ervino C. Ziemath, Alessandra L. Da Róz, Fabio L. Leite, Carolina C. Bueno
Format: Article
Language:English
Published: MDPI AG 2012-10-01
Series:International Journal of Molecular Sciences
Subjects:
van der Waals
adhesion
surface forces
atomic force microscopy
atomic force spectroscopy
structural forces
double-layer
wettability
AFM
Online Access:http://www.mdpi.com/1422-0067/13/10/12773

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