DETERMINATION OF THE STANDARD CHARACTERISTICS OF DEPTH-DOSE DISTRIBUTIONS ON THE BASE OF SEMIEMPIRICAL MODEL OF ELECTRONS ENERGY DEPOSITION

In this paper it was performed a comparison the standard characteristics of depth-dose distributions of electrons such as practical range Rp and half-value depth R50, which were calculated with the semi-empirical model (SEM) and Monte Carlo (MC) method using the detailed physical model. It was shown...

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Bibliographic Details
Main Authors: V. T. Lazurik, G. F. Popov, Z. Zimek, R. V. Lazurik, Ibrahim Salah Sovan
Format: Article
Language:English
Published: V.N. Karazin Kharkiv National University Publishing 2016-03-01
Series:East European Journal of Physics
Online Access:https://periodicals.karazin.ua/eejp/article/view/5117
Description
Summary:In this paper it was performed a comparison the standard characteristics of depth-dose distributions of electrons such as practical range Rp and half-value depth R50, which were calculated with the semi-empirical model (SEM) and Monte Carlo (MC) method using the detailed physical model. It was shown, that SEM of electrons energy deposition allows with good accuracy (<2%) to determine in aluminum target the values of standard characteristics for depth dose distributions in the energy range of electrons that provides the main practical interest for industrial radiation technologies. On the base of the SEM of electrons energy deposition, it was calculated a systematic set of values the standard characteristics of Rp(E) and R50(E) in an aluminum target in the area of relativistic energies - from 1 MeV to the border of the estimated accuracy of the semi-empirical model – 20 MeV. These data were approximated using linear and quadratic functions and obtained empirical formulas for dependences Rp(E) and R50(E) as function of electrons energy E. It was performed approbation of empirical formulas at processing the measurement results for depth dose dependencies obtained in the radiation-technological center – Institute of Nuclear Chemistry and Technologies, Warsaw, Poland.
ISSN:2312-4334
2312-4539