Work Function Adjustment by Using Dipole Engineering for TaN-Al2O3-Si3N4-HfSiOx-Silicon Nonvolatile Memory

This paper presents a novel TaN-Al2O3-HfSiOx-SiO2-silicon (TAHOS) nonvolatile memory (NVM) design with dipole engineering at the HfSiOx/SiO2 interface. The threshold voltage shift achieved by using dipole engineering could enable work function adjustment for NVM devices. The dipole layer at the tunn...

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Bibliographic Details
Main Authors: Yu-Hsien Lin, Yi-Yun Yang
Format: Article
Language:English
Published: MDPI AG 2015-08-01
Series:Materials
Subjects:
Online Access:http://www.mdpi.com/1996-1944/8/8/5112