| Summary: | Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis. Keywords: Thin films, Ferromagnetism, Atomic force microscopy
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