Light Yield Enhancement of 157-Gadolinium Oxysulfide Scintillator Screens for the High-Resolution Neutron Imaging

This paper reports on light yield enhancement of terbium-doped gadolinium oxysulfide based scintillator screens achieved by coating their substrates with thin layers of a high density and high atomic number material. For this purpose, iridium was chosen and layers of various thicknesses were applied...

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Bibliographic Details
Main Authors: Jan Crha, Joan Vila-Comamala, Eberhard Lehmann, Christian David, Pavel Trtik
Format: Article
Language:English
Published: Elsevier 2019-01-01
Series:MethodsX
Online Access:http://www.sciencedirect.com/science/article/pii/S2215016118302085
Description
Summary:This paper reports on light yield enhancement of terbium-doped gadolinium oxysulfide based scintillator screens achieved by coating their substrates with thin layers of a high density and high atomic number material. For this purpose, iridium was chosen and layers of various thicknesses were applied by atomic layer deposition (ALD). We assessed newly developed scintillator screens for neutron absorption, light yield and spatial resolution and compared them to previously used non-iridium-coated scintillator screens. The addition of the iridium layer resulted in 65 % light yield enhancement in comparison to uncoated scintillator screens while the spatial resolution and absorption power remained unchanged.Highlights • 65 % light yield enhancement of the scintillator light output with preservation of the spatial resolution • Use of atomic layer deposition for nanoengineering of the neutron sensitive scintillator screens Method name: Neutron imaging detection, Keywords: atomic layer deposition, gadolinium oxysulfide, iridium, neutron imaging, neutron microscope, scintillator screen
ISSN:2215-0161