Development of a high-energy-resolution EDXRD system with a CdTe detector for security inspection
Energy dispersive X-ray diffraction (EDXRD) has great potential for application in the field of security inspection. On the basis of the Bragg’s diffraction law, an EDXRD system simulation model was established. Using this model, the effect of geometrical parameters on the energy resolution and coll...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2018-10-01
|
| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5052027 |