Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy
Excited charge carriers, such as photoelectrons, play an important role in fundamental and technological fields. Here the authors employ an ultrafast electron microscope to directly visualize the cyclotron oscillations and oblate-to-prolate shape change of a photoemitted electron gas from a laser-ex...
Main Authors: | Omid Zandi, Allan E. Sykes, Ryan D. Cornelius, Francis M. Alcorn, Brandon S. Zerbe, Phillip M. Duxbury, Bryan W. Reed, Renske M. van der Veen |
---|---|
Format: | Article |
Language: | English |
Published: |
Nature Publishing Group
2020-06-01
|
Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-020-16746-z |
Similar Items
-
Ultrafast core-loss spectroscopy in four-dimensional electron microscopy
by: Renske M. van der Veen, et al.
Published: (2015-03-01) -
Luminescent tracks of high-energy photoemitted electrons accelerated by plasmonic fields
by: Di Vece Marcel, et al.
Published: (2015-12-01) -
Budgeting the emittance of photoemitted electron beams in a space-charge affected emission regime for free-electron laser applications
by: Y. Chen, et al.
Published: (2020-03-01) -
Spatial control of photoemitted electron beams using a microlens-array transverse-shaping technique
by: A. Halavanau, et al.
Published: (2017-10-01) -
ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY
by: A. A. Ischenko, et al.
Published: (2017-02-01)