Atomic Layer Thermopile Materials: Physics and Application

New types of thermoelectric materials characterized by highly anisotropic Fermi surfaces and thus anisotropic Seebeck coefficients are reviewed. Early studies revealed that there is an induced voltage in high TC oxide superconductors when the surface of the films is exposed to short light pulses. Su...

Full description

Bibliographic Details
Main Authors: P. X. Zhang, H.-U. Habermeier
Format: Article
Language:English
Published: Hindawi Limited 2008-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2008/329601
id doaj-a2459d72ba0643168454248c36019d7c
record_format Article
spelling doaj-a2459d72ba0643168454248c36019d7c2020-11-24T23:41:34ZengHindawi LimitedJournal of Nanomaterials1687-41101687-41292008-01-01200810.1155/2008/329601329601Atomic Layer Thermopile Materials: Physics and ApplicationP. X. Zhang0H.-U. Habermeier1Institute of Advanced Materials for Photoelcetrons, Kunming University of Science and Technology, Kunming 650051, ChinaInstitute of Advanced Materials for Photoelcetrons, Kunming University of Science and Technology, Kunming 650051, ChinaNew types of thermoelectric materials characterized by highly anisotropic Fermi surfaces and thus anisotropic Seebeck coefficients are reviewed. Early studies revealed that there is an induced voltage in high TC oxide superconductors when the surface of the films is exposed to short light pulses. Subsequent investigations proved that the effect is due to anisotropic components of the Seebeck tensor, and the type of materials is referred to atomic layer thermopile (ALT). Our recent studies indicate that multilayer thin films at the nanoscale demonstrate enhanced ALT properties. This is in agreement with the prediction in seeking the larger figure of merit (ZT) thermoelectric materials in nanostructures. The study of ALT materials provides both deep insight of anisotropic transport property of these materials and at the same time potential materials for applications, such as light detector and microcooler. By measuring the ALT properties under various perturbations, it is found that the information on anisotropic transport properties can be provided. The information sometimes is not easily obtained by other tools due to the nanoscale phase coexistence in these materials. Also, some remained open questions and future development in this research direction have been well discussed.http://dx.doi.org/10.1155/2008/329601
collection DOAJ
language English
format Article
sources DOAJ
author P. X. Zhang
H.-U. Habermeier
spellingShingle P. X. Zhang
H.-U. Habermeier
Atomic Layer Thermopile Materials: Physics and Application
Journal of Nanomaterials
author_facet P. X. Zhang
H.-U. Habermeier
author_sort P. X. Zhang
title Atomic Layer Thermopile Materials: Physics and Application
title_short Atomic Layer Thermopile Materials: Physics and Application
title_full Atomic Layer Thermopile Materials: Physics and Application
title_fullStr Atomic Layer Thermopile Materials: Physics and Application
title_full_unstemmed Atomic Layer Thermopile Materials: Physics and Application
title_sort atomic layer thermopile materials: physics and application
publisher Hindawi Limited
series Journal of Nanomaterials
issn 1687-4110
1687-4129
publishDate 2008-01-01
description New types of thermoelectric materials characterized by highly anisotropic Fermi surfaces and thus anisotropic Seebeck coefficients are reviewed. Early studies revealed that there is an induced voltage in high TC oxide superconductors when the surface of the films is exposed to short light pulses. Subsequent investigations proved that the effect is due to anisotropic components of the Seebeck tensor, and the type of materials is referred to atomic layer thermopile (ALT). Our recent studies indicate that multilayer thin films at the nanoscale demonstrate enhanced ALT properties. This is in agreement with the prediction in seeking the larger figure of merit (ZT) thermoelectric materials in nanostructures. The study of ALT materials provides both deep insight of anisotropic transport property of these materials and at the same time potential materials for applications, such as light detector and microcooler. By measuring the ALT properties under various perturbations, it is found that the information on anisotropic transport properties can be provided. The information sometimes is not easily obtained by other tools due to the nanoscale phase coexistence in these materials. Also, some remained open questions and future development in this research direction have been well discussed.
url http://dx.doi.org/10.1155/2008/329601
work_keys_str_mv AT pxzhang atomiclayerthermopilematerialsphysicsandapplication
AT huhabermeier atomiclayerthermopilematerialsphysicsandapplication
_version_ 1725506651182596096