Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film

Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film

Oxygen vacancy in different oxide systems shows up as a crucial parameter in modulation of the emerging application-oriented functionalities. A systematic exploration on the relation between oxygen vacancy and electronic structure of the La0.2Sr0.8MnO3 (LSMO) thin film has been carried out through s...

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Main Authors: Jiali Zhao, Chen Liu, Jinmei Li, Rui Wu, Jiaou Wang, Haijie Qian, Haizhong Guo, Jiankun Li, Kurash Ibrahim
Format: Article
Language:English
Published: AIP Publishing LLC 2019-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5088738
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spelling doaj-a1a2e4e343c54a7dbf12b0f15c77ab502020-11-24T21:56:39ZengAIP Publishing LLCAIP Advances2158-32262019-05-0195055208055208-610.1063/1.5088738029905ADVOxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin filmJiali Zhao0Chen Liu1Jinmei Li2Rui Wu3Jiaou Wang4Haijie Qian5Haizhong Guo6Jiankun Li7Kurash Ibrahim8Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaSchool of Physical Engineering, Zhengzhou University, Zhengzhou 450001, ChinaInstitute of Physics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, ChinaOxygen vacancy in different oxide systems shows up as a crucial parameter in modulation of the emerging application-oriented functionalities. A systematic exploration on the relation between oxygen vacancy and electronic structure of the La0.2Sr0.8MnO3 (LSMO) thin film has been carried out through sequential surface treatments followed by a series of wide scan XPS, O 1s XPS, O-K edge XAS, Mn-L edge XAS and work function measurements. Experimental results demonstrate mutual corroborative certifying evidences in between the different photoemission spectral measurements on the evolution and influence of the oxygen vacancy. Spectral characteristic features observed in the work are applicable using as justification fingerprint for the existence, modulation, or elimination of the oxygen vacancy in similar perovskite type oxide systems.http://dx.doi.org/10.1063/1.5088738
collection DOAJ
language English
format Article
sources DOAJ
author Jiali Zhao
Chen Liu
Jinmei Li
Rui Wu
Jiaou Wang
Haijie Qian
Haizhong Guo
Jiankun Li
Kurash Ibrahim
spellingShingle Jiali Zhao
Chen Liu
Jinmei Li
Rui Wu
Jiaou Wang
Haijie Qian
Haizhong Guo
Jiankun Li
Kurash Ibrahim
Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
AIP Advances
author_facet Jiali Zhao
Chen Liu
Jinmei Li
Rui Wu
Jiaou Wang
Haijie Qian
Haizhong Guo
Jiankun Li
Kurash Ibrahim
author_sort Jiali Zhao
title Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
title_short Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
title_full Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
title_fullStr Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
title_full_unstemmed Oxygen vacancy induced electronic structure variation in the La0.2Sr0.8MnO3 thin film
title_sort oxygen vacancy induced electronic structure variation in the la0.2sr0.8mno3 thin film
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2019-05-01
description Oxygen vacancy in different oxide systems shows up as a crucial parameter in modulation of the emerging application-oriented functionalities. A systematic exploration on the relation between oxygen vacancy and electronic structure of the La0.2Sr0.8MnO3 (LSMO) thin film has been carried out through sequential surface treatments followed by a series of wide scan XPS, O 1s XPS, O-K edge XAS, Mn-L edge XAS and work function measurements. Experimental results demonstrate mutual corroborative certifying evidences in between the different photoemission spectral measurements on the evolution and influence of the oxygen vacancy. Spectral characteristic features observed in the work are applicable using as justification fingerprint for the existence, modulation, or elimination of the oxygen vacancy in similar perovskite type oxide systems.
url http://dx.doi.org/10.1063/1.5088738
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