Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images
Carbon nanotube (CNT)-based cold cathodes are promising sources of field emission electrons for advanced electron devices, particularly for ultra-high-resolution imaging systems, due to their high brightness and low energy spread. While the electron field emission properties of single-tip CNT cathod...
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doaj-a02e048a2a4643859b840c378a174c1a2021-08-26T14:08:48ZengMDPI AGNanomaterials2079-49912021-07-01111918191810.3390/nano11081918Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron ImagesHa Rim Lee0Da Woon Kim1Alfi Rodiansyah2Boklae Cho3Joonwon Lim4Kyu Chang Park5Department of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 024471, KoreaDepartment of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 024471, KoreaDepartment of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 024471, KoreaAdvanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, KoreaDepartment of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 024471, KoreaDepartment of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 024471, KoreaCarbon nanotube (CNT)-based cold cathodes are promising sources of field emission electrons for advanced electron devices, particularly for ultra-high-resolution imaging systems, due to their high brightness and low energy spread. While the electron field emission properties of single-tip CNT cathodes have been intensively studied in the last few decades, a systematic study of the influencing factors on the electron beam properties of CNT cold cathodes and the resolution of the secondary electron images has been overlooked in this field. Here, we have systematically investigated the effect of the structural properties of a CNT cold cathode on the electron beam properties and resolution of secondary electron microscope (SEM) images. The aspect ratio (geometric factor) and the diameter of the tip of a vertically standing CNT cold cathode significantly affect the electron beam properties, including the beam size and brightness, and consequently determine the resolution of the secondary electron images obtained by SEM systems equipped with a CNT cold cathode module. Theoretical simulation elucidated the dependence of the structural features of CNT cold cathodes and electron beam properties on the contribution of edge-emitted electrons to the total field emission current. Investigating the correlations between the structural properties of CNT cold cathodes, the properties of the emitted electron beams, and the resolution of the secondary electron images captured by SEM equipped with CNT cold cathode modules is highly important and informative as a basic model.https://www.mdpi.com/2079-4991/11/8/1918carbon nanotubefield emissionelectron beamelectron microscope |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Ha Rim Lee Da Woon Kim Alfi Rodiansyah Boklae Cho Joonwon Lim Kyu Chang Park |
spellingShingle |
Ha Rim Lee Da Woon Kim Alfi Rodiansyah Boklae Cho Joonwon Lim Kyu Chang Park Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images Nanomaterials carbon nanotube field emission electron beam electron microscope |
author_facet |
Ha Rim Lee Da Woon Kim Alfi Rodiansyah Boklae Cho Joonwon Lim Kyu Chang Park |
author_sort |
Ha Rim Lee |
title |
Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images |
title_short |
Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images |
title_full |
Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images |
title_fullStr |
Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images |
title_full_unstemmed |
Investigation of the Effect of Structural Properties of a Vertically Standing CNT Cold Cathode on Electron Beam Brightness and Resolution of Secondary Electron Images |
title_sort |
investigation of the effect of structural properties of a vertically standing cnt cold cathode on electron beam brightness and resolution of secondary electron images |
publisher |
MDPI AG |
series |
Nanomaterials |
issn |
2079-4991 |
publishDate |
2021-07-01 |
description |
Carbon nanotube (CNT)-based cold cathodes are promising sources of field emission electrons for advanced electron devices, particularly for ultra-high-resolution imaging systems, due to their high brightness and low energy spread. While the electron field emission properties of single-tip CNT cathodes have been intensively studied in the last few decades, a systematic study of the influencing factors on the electron beam properties of CNT cold cathodes and the resolution of the secondary electron images has been overlooked in this field. Here, we have systematically investigated the effect of the structural properties of a CNT cold cathode on the electron beam properties and resolution of secondary electron microscope (SEM) images. The aspect ratio (geometric factor) and the diameter of the tip of a vertically standing CNT cold cathode significantly affect the electron beam properties, including the beam size and brightness, and consequently determine the resolution of the secondary electron images obtained by SEM systems equipped with a CNT cold cathode module. Theoretical simulation elucidated the dependence of the structural features of CNT cold cathodes and electron beam properties on the contribution of edge-emitted electrons to the total field emission current. Investigating the correlations between the structural properties of CNT cold cathodes, the properties of the emitted electron beams, and the resolution of the secondary electron images captured by SEM equipped with CNT cold cathode modules is highly important and informative as a basic model. |
topic |
carbon nanotube field emission electron beam electron microscope |
url |
https://www.mdpi.com/2079-4991/11/8/1918 |
work_keys_str_mv |
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1721191134587256832 |