Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation

• Main Authors: Yinghui Wu, Dong Wang, Jinyuan Liu, Houzhi Cai, Yueqiang Zhang
• Format: Article
• Language: English
• Published: MDPI AG 2020-09-01
• Series: Nanomaterials
• Subjects: SKPM; EFM; conductive polymers; interface
• Online Access: https://www.mdpi.com/2079-4991/10/9/1819

Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4<i>H</i>-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4,7-(2,1,3-benzothiadiazole)] (PCPDTBT) and poly(3-hexylthiophene-2,5-diyl) (P3HT). They are also widely used in order to directly observe the charge distribution and dynamic changes at the interfaces in nanostructures, owing to their high sensitivity. Using SKPM, it is proved that the charge of the photo-induced polymer PCPDTBT is transferred to Ag nanoparticles (NPs). The surface charge of the Ag-induced NPs is quantified while using EFM, and it is determined that the charge is injected into the polymer P3HT from the Ag NPs. We expect that this technology will provide guidance to facilitate the separation and transfer of the interfacial charges in the composite material systems and it will be applicable to various photovoltaic material systems.