RBER Aware Multi-Sensing for Improving Read Performance of 3D MLC NAND Flash Memory
3D-multi-level cell (MLC) NAND flash memory adopts 3D stack technology and stores two bits per cell, leading to improved storage capacities, but sacrificing data reliability. Low-density parity-check (LDPC) codes showing strong error correction capability benefit from their soft decision decoding, w...
Main Authors: | Meng Zhang, Fei Wu, Xubin Chen, Yajuan Du, Weihua Liu, Yahui Zhao, Jiguang Wan, Changsheng Xie |
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Format: | Article |
Language: | English |
Published: |
IEEE
2018-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8478389/ |
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