Automatic device for measuring of principal thermoelectric parameters of lead chalcogenides
The device intended for measuring of principal thermoelectric parameters of the narrow-gap lead chalcogenide semiconductors (the Seebeck coefficient, electrical conductivity and thermal conductivity) have been created. The device created can be controlled by personal computer. In the temperature ran...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Kazan State Power Engineering University
2018-02-01
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| Series: | Известия высших учебных заведений: Проблемы энергетики |
| Subjects: | |
| Online Access: | https://www.energyret.ru/jour/article/view/421 |
| Summary: | The device intended for measuring of principal thermoelectric parameters of the narrow-gap lead chalcogenide semiconductors (the Seebeck coefficient, electrical conductivity and thermal conductivity) have been created. The device created can be controlled by personal computer. In the temperature range from 270K to 500K the correctness of values of the thermoelectric parameters measured by the device are following: thermal conductivity – ±5,7%; electrical conductivity – ±3,5%; the Seebeck coefficient – ±4%. |
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| ISSN: | 1998-9903 |