Modeling of Durum Wheat Yield Based on Sentinel-2 Imagery

Modeling of Durum Wheat Yield Based on Sentinel-2 Imagery

In this study, a modelling approach for the estimation/prediction of wheat yield based on Sentinel-2 data is presented. Model development was accomplished through a two-step process: firstly, the capacity of Sentinel-2 vegetation indices (VIs) to follow plant ecophysiological parameters was establis...

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Bibliographic Details
Main Authors: Chris Cavalaris, Sofia Megoudi, Maria Maxouri, Konstantinos Anatolitis, Marios Sifakis, Efi Levizou, Aris Kyparissis
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Agronomy
Subjects:
durum wheat
yield modelling
Sentinel-2
NDVI
EVI
NDWI
Online Access:https://www.mdpi.com/2073-4395/11/8/1486

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