Modeling of Durum Wheat Yield Based on Sentinel-2 Imagery

• Main Authors: Chris Cavalaris, Sofia Megoudi, Maria Maxouri, Konstantinos Anatolitis, Marios Sifakis, Efi Levizou, Aris Kyparissis
• Format: Article
• Language: English
• Published: MDPI AG 2021-07-01
• Series: Agronomy
• Subjects: durum wheat; yield modelling; Sentinel-2; NDVI; EVI; NDWI
• Online Access: https://www.mdpi.com/2073-4395/11/8/1486

In this study, a modelling approach for the estimation/prediction of wheat yield based on Sentinel-2 data is presented. Model development was accomplished through a two-step process: firstly, the capacity of Sentinel-2 vegetation indices (VIs) to follow plant ecophysiological parameters was established through measurements in a pilot field and secondly, the results of the first step were extended/evaluated in 31 fields, during two growing periods, to increase the applicability range and robustness of the models. Modelling results were examined against yield data collected by a combine harvester equipped with a yield-monitoring system. Normalized Difference Vegetation Index (NDVI) and Enhanced Vegetation Index (EVI) were examined as plant signals and combined with Normalized Difference Water Index (NDWI) and/or Normalized Multiband Drought Index (NMDI) during the growth period or before sowing, as water and soil signals, respectively. The best performing model involved the EVI integral for the 20 April–31 May period as a plant signal and NMDI on 29 April and before sowing as water and soil signals, respectively (R² = 0.629, RMSE = 538). However, model versions with a single date and maximum seasonal VIs values as a plant signal, performed almost equally well. Since the maximum seasonal VIs values occurred during the last ten days of April, these model versions are suitable for yield prediction.