Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips
Conventionally, an experimentally determined phase diagram requires studies of phase formation at a range of temperatures for each composition, which takes years of effort from multiple research groups. Combinatorial materials chip technology, featuring high-throughput synthesis and characterization...
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doaj-9dda8eab28854333a261d8ed02bfef352020-11-24T22:34:25ZengElsevierEngineering2095-80992015-06-011222523310.15302/J-ENG-2015041Individualized Pixel Synthesis and Characterization of Combinatorial Materials ChipsXiao-Dong Xiang0Gang Wang1Xiaokun Zhang2Yong Xiang3Hong Wang4State Key Laboratory of Green Building Materials, China Building Materials Academy, Beijing 100024, ChinaIntematix Corporation, Fremont, CA 94538, USAState Key Laboratory of Electronic Thin Films & Integrated Devices, School of Energy Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, ChinaState Key Laboratory of Electronic Thin Films & Integrated Devices, School of Energy Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, ChinaState Key Laboratory of Green Building Materials, China Building Materials Academy, Beijing 100024, ChinaConventionally, an experimentally determined phase diagram requires studies of phase formation at a range of temperatures for each composition, which takes years of effort from multiple research groups. Combinatorial materials chip technology, featuring high-throughput synthesis and characterization, is able to determine the phase diagram of an entire composition spread of a binary or ternary system at a single temperature on one materials library, which, though significantly increasing efficiency, still requires many libraries processed at a series of temperatures in order to complete a phase diagram. In this paper, we propose a “one-chip method” to construct a complete phase diagram by individually synthesizing each pixel step by step with a progressive pulse of energy to heat at different temperatures while monitoring the phase evolution on the pixel in situ in real time. Repeating this process pixel by pixel throughout the whole chip allows the entire binary or ternary phase diagram to be mapped on one chip in a single experiment. The feasibility of this methodology is demonstrated in a study of a Ge-Sb-Te ternary alloy system, on which the amorphous-crystalline phase boundary is determined.http://www.sciencedirect.com/science/article/pii/S2095809916300674combinatorial materials chipphase diagrampixel synthesisin-situ characterizationphase-boundary determination |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Xiao-Dong Xiang Gang Wang Xiaokun Zhang Yong Xiang Hong Wang |
spellingShingle |
Xiao-Dong Xiang Gang Wang Xiaokun Zhang Yong Xiang Hong Wang Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips Engineering combinatorial materials chip phase diagram pixel synthesis in-situ characterization phase-boundary determination |
author_facet |
Xiao-Dong Xiang Gang Wang Xiaokun Zhang Yong Xiang Hong Wang |
author_sort |
Xiao-Dong Xiang |
title |
Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips |
title_short |
Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips |
title_full |
Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips |
title_fullStr |
Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips |
title_full_unstemmed |
Individualized Pixel Synthesis and Characterization of Combinatorial Materials Chips |
title_sort |
individualized pixel synthesis and characterization of combinatorial materials chips |
publisher |
Elsevier |
series |
Engineering |
issn |
2095-8099 |
publishDate |
2015-06-01 |
description |
Conventionally, an experimentally determined phase diagram requires studies of phase formation at a range of temperatures for each composition, which takes years of effort from multiple research groups. Combinatorial materials chip technology, featuring high-throughput synthesis and characterization, is able to determine the phase diagram of an entire composition spread of a binary or ternary system at a single temperature on one materials library, which, though significantly increasing efficiency, still requires many libraries processed at a series of temperatures in order to complete a phase diagram. In this paper, we propose a “one-chip method” to construct a complete phase diagram by individually synthesizing each pixel step by step with a progressive pulse of energy to heat at different temperatures while monitoring the phase evolution on the pixel in situ in real time. Repeating this process pixel by pixel throughout the whole chip allows the entire binary or ternary phase diagram to be mapped on one chip in a single experiment. The feasibility of this methodology is demonstrated in a study of a Ge-Sb-Te ternary alloy system, on which the amorphous-crystalline phase boundary is determined. |
topic |
combinatorial materials chip phase diagram pixel synthesis in-situ characterization phase-boundary determination |
url |
http://www.sciencedirect.com/science/article/pii/S2095809916300674 |
work_keys_str_mv |
AT xiaodongxiang individualizedpixelsynthesisandcharacterizationofcombinatorialmaterialschips AT gangwang individualizedpixelsynthesisandcharacterizationofcombinatorialmaterialschips AT xiaokunzhang individualizedpixelsynthesisandcharacterizationofcombinatorialmaterialschips AT yongxiang individualizedpixelsynthesisandcharacterizationofcombinatorialmaterialschips AT hongwang individualizedpixelsynthesisandcharacterizationofcombinatorialmaterialschips |
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