CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS

The microstructure of transparent YAG ceramics is investigated by stereology-based microscopic image analysis using SEM and FE-SEM micrographs. Interface densities, mean curvature integral densities and the related grain size measures (mean chord length and Jeffries size) have been determined with r...

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Main Authors: Tereza Uhlirova, Jan Hostasa, Pabst Willi
Format: Article
Language:English
Published: University of Chemistry and Technology, Prague 2014-09-01
Series:Ceramics-Silikáty
Subjects:
Online Access: http://www.ceramics-silikaty.cz/2014/pdf/2014_03_173.pdf
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spelling doaj-9d0024d428a24505868f448a686e60ea2020-11-24T22:37:17ZengUniversity of Chemistry and Technology, PragueCeramics-Silikáty0862-54681804-58472014-09-01583173183.20160312095142CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSISTereza Uhlirova0Jan Hostasa1Pabst Willi2 Department of Glass and Ceramics, Institute of Chemical Technology, Prague (ICT Prague), Technicka 5, 166 28 Prague 6, Czech Republic Department of Glass and Ceramics, Institute of Chemical Technology, Prague (ICT Prague), Technicka 5, 166 28 Prague 6, Czech Republic Department of Glass and Ceramics, Institute of Chemical Technology, Prague (ICT Prague), Technicka 5, 166 28 Prague 6, Czech Republic The microstructure of transparent YAG ceramics is investigated by stereology-based microscopic image analysis using SEM and FE-SEM micrographs. Interface densities, mean curvature integral densities and the related grain size measures (mean chord length and Jeffries size) have been determined with relative errors of 9-12 % for interface densities and mean curvature integral densities and 6-9 % for the corresponding grain size measures. A comparison of the two grain size measures confi rmed an excellent linear correlation between the Jeffries size and the mean chord length, with a mean-chordlength-to-Jeffries-size ratio of 0.928 +/- 0.086. The overall range of average grain sizes is approx. 11-34 μm. It has been found that the sintering time has a signifi cant influence on the grain size, especially for YAG ceramics without Yb doping. When the sintering time is increased by a factor 8 (from 2 h to 16 h) the grain size increases by more than 200 % in undoped YAG ceramics, whereas the grain growth is much weaker in Yb-doped YAG ceramics (grain growth only 50-70 % for YAG ceramics with 5-10 at.% Yb). Thus it can be concluded that the Yb dopant acts as a grain growth inhibitor in YAG ceramics, at least for suffi ciently long sintering times (8 h and more). The infl uence of the sintering additive (tetraethyl orthosilicate TEOS) content on the grain size is negligible in the concentration range tested (0.3-0.5 wt.%). http://www.ceramics-silikaty.cz/2014/pdf/2014_03_173.pdf YAG ceramics, Yb-doping, solid state lasers, microstructure, image analysis, stereology, stereological relations, grain size (mean chord length, Jeffries size), interface density (grain boundary density), mean curvature integral density, edge length density (triple junction line length density)
collection DOAJ
language English
format Article
sources DOAJ
author Tereza Uhlirova
Jan Hostasa
Pabst Willi
spellingShingle Tereza Uhlirova
Jan Hostasa
Pabst Willi
CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
Ceramics-Silikáty
YAG ceramics, Yb-doping, solid state lasers, microstructure, image analysis, stereology, stereological relations, grain size (mean chord length, Jeffries size), interface density (grain boundary density), mean curvature integral density, edge length density (triple junction line length density)
author_facet Tereza Uhlirova
Jan Hostasa
Pabst Willi
author_sort Tereza Uhlirova
title CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
title_short CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
title_full CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
title_fullStr CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
title_full_unstemmed CHARACTERIZATION OF THE MICROSTRUCTURE OF YAG CERAMICS VIA STEREOLOGY-BASED IMAGE ANALYSIS
title_sort characterization of the microstructure of yag ceramics via stereology-based image analysis
publisher University of Chemistry and Technology, Prague
series Ceramics-Silikáty
issn 0862-5468
1804-5847
publishDate 2014-09-01
description The microstructure of transparent YAG ceramics is investigated by stereology-based microscopic image analysis using SEM and FE-SEM micrographs. Interface densities, mean curvature integral densities and the related grain size measures (mean chord length and Jeffries size) have been determined with relative errors of 9-12 % for interface densities and mean curvature integral densities and 6-9 % for the corresponding grain size measures. A comparison of the two grain size measures confi rmed an excellent linear correlation between the Jeffries size and the mean chord length, with a mean-chordlength-to-Jeffries-size ratio of 0.928 +/- 0.086. The overall range of average grain sizes is approx. 11-34 μm. It has been found that the sintering time has a signifi cant influence on the grain size, especially for YAG ceramics without Yb doping. When the sintering time is increased by a factor 8 (from 2 h to 16 h) the grain size increases by more than 200 % in undoped YAG ceramics, whereas the grain growth is much weaker in Yb-doped YAG ceramics (grain growth only 50-70 % for YAG ceramics with 5-10 at.% Yb). Thus it can be concluded that the Yb dopant acts as a grain growth inhibitor in YAG ceramics, at least for suffi ciently long sintering times (8 h and more). The infl uence of the sintering additive (tetraethyl orthosilicate TEOS) content on the grain size is negligible in the concentration range tested (0.3-0.5 wt.%).
topic YAG ceramics, Yb-doping, solid state lasers, microstructure, image analysis, stereology, stereological relations, grain size (mean chord length, Jeffries size), interface density (grain boundary density), mean curvature integral density, edge length density (triple junction line length density)
url http://www.ceramics-silikaty.cz/2014/pdf/2014_03_173.pdf
work_keys_str_mv AT terezauhlirova characterizationofthemicrostructureofyagceramicsviastereologybasedimageanalysis
AT janhostasa characterizationofthemicrostructureofyagceramicsviastereologybasedimageanalysis
AT pabstwilli characterizationofthemicrostructureofyagceramicsviastereologybasedimageanalysis
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