Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique
<p>The paper presents the study of the optical properties of a thin layer of Cadmium Sulphide deposited on Cadmium Telluride films. CdTe thin films were obtained by vapor phase condensation method using different technological factors, in particular, different thickness (different time of depo...
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Vasyl Stefanyk Precarpathian National University
2018-10-01
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doaj-9c981d542bd04f37b273bc284375cdaa2020-11-25T02:20:06ZengVasyl Stefanyk Precarpathian National UniversityФізика і хімія твердого тіла1729-44282309-85892018-10-0119320921610.15330/pcss.19.3.209-2162767Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition techniqueLyubomyr Nykyruy0Olha Yaremiichuk1Zhanna Zapukhlyak2Rostyslav Yavorskyi3Piotr Potera4Ivanna Malyarska5Olga Fedoryk6Прикарпатський національний університет імені Василя СтефаникаЖешувський університетПрикарпатський національний університет імені Василя СтефаникаПрикарпатський національний університет імені Василя СтефаникаЖешувський університетПрикарпатський національний університет імені Василя СтефаникаПрикарпатський національний університет імені Василя Стефаника<p>The paper presents the study of the optical properties of a thin layer of Cadmium Sulphide deposited on Cadmium Telluride films. CdTe thin films were obtained by vapor phase condensation method using different technological factors, in particular, different thickness (different time of deposition τ) on glass substrates. After deposition the optical properties were analysed by Swanepoel method, using transmission spectra. The upper thin layer of CdS was deposited by thermal evaporation method on CdTe thin films. The change in optical properties of CdS/CdTe heterojunction in comparison with CdTe thin films was investigated. Using a Swanepoel method were calculated the main optical constants, such as refractive index, absorption coefficient and optical conductivity. By this method the thickness of the thin film was determined and compared with the experimental values obtained by the profilometer.</p>http://journals.pu.if.ua/index.php/pcss/article/view/3275 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Lyubomyr Nykyruy Olha Yaremiichuk Zhanna Zapukhlyak Rostyslav Yavorskyi Piotr Potera Ivanna Malyarska Olga Fedoryk |
spellingShingle |
Lyubomyr Nykyruy Olha Yaremiichuk Zhanna Zapukhlyak Rostyslav Yavorskyi Piotr Potera Ivanna Malyarska Olga Fedoryk Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique Фізика і хімія твердого тіла |
author_facet |
Lyubomyr Nykyruy Olha Yaremiichuk Zhanna Zapukhlyak Rostyslav Yavorskyi Piotr Potera Ivanna Malyarska Olga Fedoryk |
author_sort |
Lyubomyr Nykyruy |
title |
Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique |
title_short |
Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique |
title_full |
Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique |
title_fullStr |
Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique |
title_full_unstemmed |
Optical properties of CdS/CdTe heterojunction prepared by physical vapor deposition technique |
title_sort |
optical properties of cds/cdte heterojunction prepared by physical vapor deposition technique |
publisher |
Vasyl Stefanyk Precarpathian National University |
series |
Фізика і хімія твердого тіла |
issn |
1729-4428 2309-8589 |
publishDate |
2018-10-01 |
description |
<p>The paper presents the study of the optical properties of a thin layer of Cadmium Sulphide deposited on Cadmium Telluride films. CdTe thin films were obtained by vapor phase condensation method using different technological factors, in particular, different thickness (different time of deposition τ) on glass substrates. After deposition the optical properties were analysed by Swanepoel method, using transmission spectra. The upper thin layer of CdS was deposited by thermal evaporation method on CdTe thin films. The change in optical properties of CdS/CdTe heterojunction in comparison with CdTe thin films was investigated. Using a Swanepoel method were calculated the main optical constants, such as refractive index, absorption coefficient and optical conductivity. By this method the thickness of the thin film was determined and compared with the experimental values obtained by the profilometer.</p> |
url |
http://journals.pu.if.ua/index.php/pcss/article/view/3275 |
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