Cautions to predicate multiferroic by atomic force microscopy

Cautions to predicate multiferroic by atomic force microscopy

With the ever-increasing research activities in multiferroic driven by its profound physics and enormous potential for application, magnetic force microscopy (MFM), as a variety of atomic force microscope (AFM), has been brought to investigate the magnetic properties an...

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Main Authors: Chen Liu, Jing Ma, Ji Ma, Yujun Zhang, Jiahui Chen, Ce-Wen Nan
Format: Article
Language:English
Published: AIP Publishing LLC 2017-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4983271
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spelling doaj-9b15c2f811064888b0c74de115771bc12020-11-25T00:37:42ZengAIP Publishing LLCAIP Advances2158-32262017-05-0175055003055003-610.1063/1.4983271017705ADVCautions to predicate multiferroic by atomic force microscopyChen Liu0Jing Ma1Ji Ma2Yujun Zhang3Jiahui Chen4Ce-Wen Nan5State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaState Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaState Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaState Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaState Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaState Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, ChinaWith the ever-increasing research activities in multiferroic driven by its profound physics and enormous potential for application, magnetic force microscopy (MFM), as a variety of atomic force microscope (AFM), has been brought to investigate the magnetic properties and the voltage controlled magnetism, especially in thin films and heterostructures. Here by taking a representative multiferroic system BiFeO3/La0.67Sr0.33MnO3 heterostructure and a ferroelectric PMN-PT single crystal for examples, we demonstrated that the MFM image is prone to be seriously interfered by the electrostatic interaction between the tip and sample surface, and misleads the predication of multiferroic. Assisted by the scanning Kelvin probe microscopy (SKPM), the origin and mechanism were discussed and an effective solution was proposed.http://dx.doi.org/10.1063/1.4983271
collection DOAJ
language English
format Article
sources DOAJ
author Chen Liu
Jing Ma
Ji Ma
Yujun Zhang
Jiahui Chen
Ce-Wen Nan
spellingShingle Chen Liu
Jing Ma
Ji Ma
Yujun Zhang
Jiahui Chen
Ce-Wen Nan
Cautions to predicate multiferroic by atomic force microscopy
AIP Advances
author_facet Chen Liu
Jing Ma
Ji Ma
Yujun Zhang
Jiahui Chen
Ce-Wen Nan
author_sort Chen Liu
title Cautions to predicate multiferroic by atomic force microscopy
title_short Cautions to predicate multiferroic by atomic force microscopy
title_full Cautions to predicate multiferroic by atomic force microscopy
title_fullStr Cautions to predicate multiferroic by atomic force microscopy
title_full_unstemmed Cautions to predicate multiferroic by atomic force microscopy
title_sort cautions to predicate multiferroic by atomic force microscopy
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2017-05-01
description With the ever-increasing research activities in multiferroic driven by its profound physics and enormous potential for application, magnetic force microscopy (MFM), as a variety of atomic force microscope (AFM), has been brought to investigate the magnetic properties and the voltage controlled magnetism, especially in thin films and heterostructures. Here by taking a representative multiferroic system BiFeO3/La0.67Sr0.33MnO3 heterostructure and a ferroelectric PMN-PT single crystal for examples, we demonstrated that the MFM image is prone to be seriously interfered by the electrostatic interaction between the tip and sample surface, and misleads the predication of multiferroic. Assisted by the scanning Kelvin probe microscopy (SKPM), the origin and mechanism were discussed and an effective solution was proposed.
url http://dx.doi.org/10.1063/1.4983271
work_keys_str_mv AT chenliu cautionstopredicatemultiferroicbyatomicforcemicroscopy
AT jingma cautionstopredicatemultiferroicbyatomicforcemicroscopy
AT jima cautionstopredicatemultiferroicbyatomicforcemicroscopy
AT yujunzhang cautionstopredicatemultiferroicbyatomicforcemicroscopy
AT jiahuichen cautionstopredicatemultiferroicbyatomicforcemicroscopy
AT cewennan cautionstopredicatemultiferroicbyatomicforcemicroscopy
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