Deep Level Saturation Spectroscopy
We review the “Deep Level Saturation Spectroscopy” (DLSS) as the nonlinear method to study the deep local defects in semiconductors. The essence of a method is determined by the processes of sufficiently strong laser modulation (up to saturation) of quasistationar two-step absorption of the probe li...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
2012-01-01
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| Series: | International Journal of Optics |
| Online Access: | http://dx.doi.org/10.1155/2012/505023 |