39 fJ/bit On-Chip Identification ofWireless Sensors Based on Manufacturing Variation
A 39 fJ/bit IC identification system based on FET mismatch is presented and implemented in a 130 nm CMOS process. ID bits are generated based on the ΔVT between identically drawn NMOS devices due to manufacturing variation, and the ID cell structure allows for the characterization of ID bit reliabil...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2014-09-01
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| Series: | Journal of Low Power Electronics and Applications |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9268/4/3/252 |