Study on the Relationship between BO–LID and LeTID in Czochralski-Grown Monocrystalline Silicon

Most research about Light and elevated Temperature Induced Degradation (LeTID) is focused on multicrystalline silicon (mc-Si). In this work, the degradation kinetics of Czochralski-grown monocrystalline silicon (Cz-Si) induced by light at an elevated temperature were studied in detail. The lifetime...

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Bibliographic Details
Main Authors: Hailing Li, Xinxin Wang, Fang Lv, Yibo Wang, Shangzhi Cheng, Chunlan Zhou, Wenjing Wang
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/13/22/5961