Tilt angle dependence of the modulated interference effects in photo-elastic modulators

• Main Authors: Md. Abdul Ahad Talukder, Wilhelmus J. Geerts
• Format: Article
• Language: English
• Published: AIP Publishing LLC 2017-05-01
• Series: AIP Advances
• Online Access: http://dx.doi.org/10.1063/1.4975999

The effect of the PEM tilt angle and incident polarization on the PEM interference is studied for a single axis photo-elastic modulator. The dc, 1ω, and 2ω components of the detector signal vary periodically as a function of PEM tilt angle. Although it is possible to adjust the PEM tilt angle to minimize the 1ω or 2ω detector signal at small tilt angles, it is not possible to null both of them simultaneously. For the case where no analyzer is used, the ac detector signals can be minimized simultaneously by adjusting the polarization angle of the light incident on the PEM and the PEM tilt angle. Direct observations of the detector signal indicate that the effects of refraction index and thickness variations are opposite consistent with a lower polarizability for compressive strain of the modulator.