Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations

Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations

The application of spectral reflectance indices (SRIs) as proxies to screen for yield potential (YP) and heat stress (HS) is emerging in crop breeding programs. Thus, a comparison of SRIs and their associations with grain yield (GY) under YP and HS conditions is important. In this study, we assessed...

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Bibliographic Details
Main Author: Caiyun LIU, Francisco PINTO, C. Mariano COSSANI, Sivakumar SUKUMARAN, Matthew P. REYNOLDS
Format: Article
Language:English
Published: Higher Education Press 2019-09-01
Series:Frontiers of Agricultural Science and Engineering
Subjects:
genome-wide association study (gwas)|heat tolerance|spectral reflectance|spring wheat
Online Access:http://academic.hep.com.cn/fase/fileup/2095-7505/PDF/24933/1557903205711-169892261.pdf

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