Spectral reflectance indices as proxies for yield potential and heat stress tolerance in spring wheat: heritability estimates and marker-trait associations
The application of spectral reflectance indices (SRIs) as proxies to screen for yield potential (YP) and heat stress (HS) is emerging in crop breeding programs. Thus, a comparison of SRIs and their associations with grain yield (GY) under YP and HS conditions is important. In this study, we assessed...
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| Format: | Article |
| Language: | English |
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Higher Education Press
2019-09-01
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| Series: | Frontiers of Agricultural Science and Engineering |
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| Online Access: | http://academic.hep.com.cn/fase/fileup/2095-7505/PDF/24933/1557903205711-169892261.pdf |