Effect of thermal exposure on the stress-rupture life and microstructure of a low Re-containing single crystal alloy

In this paper, the stress-rupture tests of a low Re-containing single crystal alloy IC21 before and after thermal exposure at 1100 °C for various periods of time were conducted under the test condition of 1100 °C/137 MPa, and the microstructure of the tested specimens was characterized by SEM and TE...

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Bibliographic Details
Main Authors: Heng Zhang, Yunfei Liang, Yi Ru, Shusuo Li, Jian Zhou, Shengkai Gong
Format: Article
Language:English
Published: Elsevier 2015-02-01
Series:Progress in Natural Science: Materials International
Subjects:
TEM
Online Access:http://www.sciencedirect.com/science/article/pii/S1002007115000118