Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"

Electric power quality measuring device "Yakist-E1" was developed at the V.M. Glushkov Institute of Cybernetics. The device use a new method and structure of a quality determination device, and it based on calculating the deviations from the nominal values of voltage and frequency values....

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Main Authors: Oleksiy Bahatskji, Valentyn Bahatskji
Format: Article
Language:English
Published: V.M. Glushkov Institute of Cybernetics 2020-03-01
Series:Кібернетика та комп'ютерні технології
Subjects:
Online Access:http://cctech.org.ua/13-vertikalnoe-menyu-en/116-abstract-20-1-10-arte
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spelling doaj-97c20be12cb249709b1fc71f3f5d6ac52021-05-21T19:33:44ZengV.M. Glushkov Institute of CyberneticsКібернетика та комп'ютерні технології2707-45012707-451X2020-03-011939810.34229/2707-451X.20.1.1010-34229-2707-451X-20-1-10Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"Oleksiy Bahatskji0Valentyn Bahatskji1https://orcid.org/0000-0003-2550-3133V.M. Glushkov Institute of Cybernetics, Kyiv, UkraineV.M. Glushkov Institute of Cybernetics, Kyiv, UkraineElectric power quality measuring device "Yakist-E1" was developed at the V.M. Glushkov Institute of Cybernetics. The device use a new method and structure of a quality determination device, and it based on calculating the deviations from the nominal values of voltage and frequency values. The methodical error of level quantization for a 10-bit ADC is ± 0.1%. To achieve an approximation error of ± 0.1%, it is necessary to measure the voltage near the amplitude value after 170 ms. The channel for voltage measuring in the device consists of a voltage transformer, a high-precision resistive divider that scales and biases the input voltage, a reference voltage source (VREF) and an ADC, which built into the microcontroller. The device "Yakist-E1" uses an 8-bit microcontroller type C8051F320, which has a 10-bit ADC with an input signal range from 0 to 2.5 V. The output voltage of the VREF from the chip to the controller chip can vary from 2.38 V to 2.5 V. In addition, different transformer sensors may have different transfer characteristics, which may be non-linear. Therefore, to indicate the values of the measured voltage on the alphanumeric indicator, a piecewise linear approximation of the results of measuring the ADC is used. The transfer and temperature characteristics of the voltage transformer were measured for forward and reverse passages, and, according to the results, was discovered that the temperature error is very small and practically does not affect the accuracy of the sensor and the sensor has hysteresis, the calculated errors do not exceed ± 1%. All this errors were corrected. To determine the deviation of the amplitude value from the nominal value, only 8 low-order bits of the ADC are used. This trick grants that ADC result can be processed by a single command of the microcontroller, which increases processing speed of the channel.http://cctech.org.ua/13-vertikalnoe-menyu-en/116-abstract-20-1-10-artemeasuring channelsensortransfer characteristicserrorsapproximation
collection DOAJ
language English
format Article
sources DOAJ
author Oleksiy Bahatskji
Valentyn Bahatskji
spellingShingle Oleksiy Bahatskji
Valentyn Bahatskji
Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
Кібернетика та комп'ютерні технології
measuring channel
sensor
transfer characteristics
errors
approximation
author_facet Oleksiy Bahatskji
Valentyn Bahatskji
author_sort Oleksiy Bahatskji
title Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
title_short Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
title_full Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
title_fullStr Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
title_full_unstemmed Channel of Measurement and Indication of 220 Voltage in the Device "Quality-E1"
title_sort channel of measurement and indication of 220 voltage in the device "quality-e1"
publisher V.M. Glushkov Institute of Cybernetics
series Кібернетика та комп'ютерні технології
issn 2707-4501
2707-451X
publishDate 2020-03-01
description Electric power quality measuring device "Yakist-E1" was developed at the V.M. Glushkov Institute of Cybernetics. The device use a new method and structure of a quality determination device, and it based on calculating the deviations from the nominal values of voltage and frequency values. The methodical error of level quantization for a 10-bit ADC is ± 0.1%. To achieve an approximation error of ± 0.1%, it is necessary to measure the voltage near the amplitude value after 170 ms. The channel for voltage measuring in the device consists of a voltage transformer, a high-precision resistive divider that scales and biases the input voltage, a reference voltage source (VREF) and an ADC, which built into the microcontroller. The device "Yakist-E1" uses an 8-bit microcontroller type C8051F320, which has a 10-bit ADC with an input signal range from 0 to 2.5 V. The output voltage of the VREF from the chip to the controller chip can vary from 2.38 V to 2.5 V. In addition, different transformer sensors may have different transfer characteristics, which may be non-linear. Therefore, to indicate the values of the measured voltage on the alphanumeric indicator, a piecewise linear approximation of the results of measuring the ADC is used. The transfer and temperature characteristics of the voltage transformer were measured for forward and reverse passages, and, according to the results, was discovered that the temperature error is very small and practically does not affect the accuracy of the sensor and the sensor has hysteresis, the calculated errors do not exceed ± 1%. All this errors were corrected. To determine the deviation of the amplitude value from the nominal value, only 8 low-order bits of the ADC are used. This trick grants that ADC result can be processed by a single command of the microcontroller, which increases processing speed of the channel.
topic measuring channel
sensor
transfer characteristics
errors
approximation
url http://cctech.org.ua/13-vertikalnoe-menyu-en/116-abstract-20-1-10-arte
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