Interference Stripe Noise Reduction of CMOS Sensor-Based Digital Holographic Measurement System
Comparing with the application of charge coupled device (CCD) sensor, a kind of interference stripe noise (ISN) can be observed easily from the complementary metal-oxide-semiconductor (CMOS) sensor-based digital holographic measurement (DHM) system because a series of optic coatings and filters are...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9435089/ |