Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters

We consider limitations typical for semiconductor devices of up-to-date converter equipment based on silicon and silicone technologies. The reasons for processing complexities in creating the hardware components of heavy-current devices based on wide-band-gap semiconductors are analyzed. Possible ap...

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Main Authors: Ilicheva Tatiana, Panyutin Eugeny
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201823901019
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spelling doaj-963eb198d52e4e589002d07670333d042021-03-02T11:11:12ZengEDP SciencesMATEC Web of Conferences2261-236X2018-01-012390101910.1051/matecconf/201823901019matecconf_ts2018_01019Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power convertersIlicheva Tatiana0Panyutin Eugeny1Admiral Makarov State University of Maritime and Island SippingIoffe Physical Technical InstituteWe consider limitations typical for semiconductor devices of up-to-date converter equipment based on silicon and silicone technologies. The reasons for processing complexities in creating the hardware components of heavy-current devices based on wide-band-gap semiconductors are analyzed. Possible approach to production of large area SiC-diodes and thyristors is formulated, which at post-processing stage allows performing modification of their voltage-current characteristics (VCC) and increasing in its non-linearity coefficient. Based on the concept of integrated power devices containing mesa-elements with VCC with random parameters, the possibility of sequential automated exclusion of those single “non-standard” micro-devices to adversely impact on general voltage-current characteristics of an array is considered. Algorithm is briefly described, and computer modelling of transformation of the reverse branch of integrated VCC occurring in the course of such modification is provided, which made it possible to establish relationship between the typical probability distributions of impurity (including in the presence of dislocations) and certain features of final VCC.https://doi.org/10.1051/matecconf/201823901019
collection DOAJ
language English
format Article
sources DOAJ
author Ilicheva Tatiana
Panyutin Eugeny
spellingShingle Ilicheva Tatiana
Panyutin Eugeny
Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
MATEC Web of Conferences
author_facet Ilicheva Tatiana
Panyutin Eugeny
author_sort Ilicheva Tatiana
title Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
title_short Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
title_full Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
title_fullStr Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
title_full_unstemmed Integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
title_sort integrated technologies and the problem of creation of large-area silicone carbide devices for high-power converters
publisher EDP Sciences
series MATEC Web of Conferences
issn 2261-236X
publishDate 2018-01-01
description We consider limitations typical for semiconductor devices of up-to-date converter equipment based on silicon and silicone technologies. The reasons for processing complexities in creating the hardware components of heavy-current devices based on wide-band-gap semiconductors are analyzed. Possible approach to production of large area SiC-diodes and thyristors is formulated, which at post-processing stage allows performing modification of their voltage-current characteristics (VCC) and increasing in its non-linearity coefficient. Based on the concept of integrated power devices containing mesa-elements with VCC with random parameters, the possibility of sequential automated exclusion of those single “non-standard” micro-devices to adversely impact on general voltage-current characteristics of an array is considered. Algorithm is briefly described, and computer modelling of transformation of the reverse branch of integrated VCC occurring in the course of such modification is provided, which made it possible to establish relationship between the typical probability distributions of impurity (including in the presence of dislocations) and certain features of final VCC.
url https://doi.org/10.1051/matecconf/201823901019
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AT panyutineugeny integratedtechnologiesandtheproblemofcreationoflargeareasiliconecarbidedevicesforhighpowerconverters
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