Constraining neutrino mass in dark energy dark matter interaction and comparison with 2018 Planck results
Abstract In this paper, we investigate the constraints on the total neutrino mass $$\sum m_{\nu }$$ ∑ m ν in a cosmological model in which dark energy and neutrinos are coupled such that the mass of the neutrinos and potentials are function of the scalar field as $$m_{\nu }=m_{0}\exp (\frac{\alpha \...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2021-05-01
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Series: | European Physical Journal C: Particles and Fields |
Online Access: | https://doi.org/10.1140/epjc/s10052-021-09267-6 |
Summary: | Abstract In this paper, we investigate the constraints on the total neutrino mass $$\sum m_{\nu }$$ ∑ m ν in a cosmological model in which dark energy and neutrinos are coupled such that the mass of the neutrinos and potentials are function of the scalar field as $$m_{\nu }=m_{0}\exp (\frac{\alpha \phi }{m_{pl}})$$ m ν = m 0 exp ( α ϕ m pl ) and $$V(\phi )=m_{pl}^{4}\exp (\frac{-\lambda \phi }{m_{pl}})$$ V ( ϕ ) = m pl 4 exp ( - λ ϕ m pl ) respectively. The observational data used in this work include the type Ia supernovae (SN) observation (Pantheon compilation), CC, CMB and BAO data. We find that the neutrino mass is tightly constrained to $$\sum m_{\nu }< 0.125$$ ∑ m ν < 0.125 eV 95% Confidence Level (C.L.) and the effective extra relativistic degrees of freedom to be $$N_{eff}=2.955^{+0.11}_{-0.12}$$ N eff = 2 . 955 - 0.12 + 0.11 68% C.L in agreement with the Standard Model prediction $$ N_{eff} = 3.046$$ N eff = 3.046 , matter-radiation equality, $$z_{eq}=3389^{+24}_{25}$$ z eq = 3389 25 + 24 (68% C.L). These results are in good agreement with the results of Planck 2018 where the limit of the total neutrino mass is $$\sum m_{\nu }<0.12$$ ∑ m ν < 0.12 eV (95% C.L., TT, TE, EE + lowE + lensing + BAO) , $$N_{eff}=2.99^{+0.17}_{-0.17}$$ N eff = 2 . 99 - 0.17 + 0.17 (68% C.L., TT, TE, EE + lowE + lensing + BAO) and $$z_{eq}=3387^{+21}_{21}$$ z eq = 3387 21 + 21 (68% C.L TT, TE, EE + lowE + lensing + BAO). |
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ISSN: | 1434-6044 1434-6052 |